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Book dossier
by L. Randall Canfield
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Calibration of x-ray and gamma-ray measuring instruments
Paul J. Lamperti
Recommended Practice
American Institute of Aeronautics and As
Basic Metrology for ISO 9000 Certification
G. M. S. de Silva
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
James E. Potzick
Calibration of a 90 ̊V-notch weir using parameters other than upstream head
Robert Eli
Post-launch calibration of satellite sensors
Amelia M. Budge
Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
Carol F. Vezzetti
National Voluntary Laboratory Accreditation Program
NVLAP (Program : U.S.)
Alpha-particle calibrations
J. M. R. Hutchinson
Quality assurance of U.S. Geological Survey stream current meters
E. F. Hubbard