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Book dossier
by Charles Riborg Mann
No description is available for this edition yet.
Handbook of Optical Metrology
Toru Yoshizawa
Introduction to Nonimaging Optics
Julio Chaves
Interferogram analysis for optical testing
Daniel Malacara
ICONO '98
ICONO '98 (1998 Moscow, Russia)
Second-order Nonlinear Optical Characterization Techniques
Thierry Verbiest
Optical inspection of microsystems
Wolfgang Osten
X-ray polarimetry
Ronaldo Bellazzini
Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems
Carol F. Vezzetti
Introduction to Optical Metrology
Rajpal S. Sirohi