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by National Semiconductor Corporation
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Mode-stirred method implementation for HIRF susceptibility testing and results comparison with anechoic method
Truong X. Nguyen
Interface databook
National Semiconductor Corporation
Modula-2*
Walter F. Tichy
Applied research study
Ronald J. Leach
Independent Orbiter assessment
H. J. Lowery
Getting to Know Arcview Gis
Environmental Systems Research Institute
Academic research equipment in computer science, central computer facilities and engineering, 1989
Bradford Chaney
Introduction to teleprocessing
James Martin