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A simple method of obtaining concentration depth-profiles from X-ray diffraction — ReaderExpo

A simple method of obtaining concentration depth-profiles from X-ray diffraction

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A simple method of obtaining concentration depth-profiles from X-ray diffraction

by Karl E. Wiedemann

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Convolution integralsDiffraction patternsX ray diffractionLuminous intensityDepth measurement

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Study of one- and two-dimensional filtering and deconvolution algorithms for a streaming array computer

George E. Ioup

Recent advances in visualizing 3D flow with LIC

Victoria L. Interrante